Method of measurement of thickness of uniaxial anisotropic crystals and thermal control of bessel beam transformation
V.D. Paranin, S.V. Karpeev

 

Samara State Aerospace University, Samara, Russia,

Image Processing Systems Institute, Russian Academy of Sciences, Samara, Russia

Full text of article: Russian language.

Abstract:
We propose a method of polarization-based measurement of thickness and birefringence of uniaxial crystal X-cuts, which consists in measuring the spectral transmittance of a "polarizer-crystal-analyzer" structure. With use of X-cuts of a congruent lithium niobate with a nominal thickness of 1.052 mm, the validity of the method is experimentally confirmed and recommendations on its practical use are made. A possibility to control the Bessel beam conversion in CaCO3 crystal via changing its thickness is shown. The controlled conversion of a zero-order Bessel beam into a second-order vortex Bessel beam due to effect of the thermal linear expansion of a crystal by heating is experimentally investigated.

Keywords:
birefringence, uniaxial crystal, transmission spectrum, measurement of thickness, vortex Bessel beams, control of beam conversion, thermal expansion.

Citation:
Paranin VD, Karpeev SV. Method of measurement and thermal control of uniaxial crystal thickness. Computer Optics 2016; 40(1): 36-44. DOI: 10.18287/2412-6179-2016-40-1-36-44.

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