Characterization of the surface relief of film diffractive optical elements
T.P. Kaminskaya, V.V. Popov, A.M. Saletsky


Lomonosov Moscow State University, Moscow, Russia

Full text of article: Russian language.

The surface relief of film reflective diffractive optical elements (DOE) has been characterized by atomic force microscopy. The elements under study were fabricated using a variety of microfabrication techniques: traditional laser recoding of reflection rainbow holograms, Dot matrix and Kinemax technologies, and e-beam lithography. The influence of these technologies on the relief characteristics has been estimated. It has been shown that the choice of such technologies is defined by the necessity to obtain corresponding optical characteristics of diffractive optical elements.

diffractive optical elements, atomic force microscope, diffraction efficiency, surface-relief parameters.

Kaminskaya TP, Popov VV, Saletsky AM. Characterization of the surface relief of film diffractive optical elements. Computer Optics. 2016; 40(2): 215-224. DOI: 10.18287/2412-6179-2016-40-2-215-2244.


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