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Surface roughness evaluation using a direction field

A.G. Nalimov1,2, V.V. Kotlyar1,2, R.V. Skidanov1,2
1Image Processing Systems Institute of RAS
2Samara State Aerospace University

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Pages: 71-73.

The paper describes a surface roughness measuring technique. Since the direct measurement of the surface roughness is complicated when roughness amplitude is small, the roughness is measured indirectly by measuring the dislocation density in the speckle interferogram. The relationship between the dislocation density and the roughness amplitude of the investigated surface is used. A directional field of the speckle interferogram is used to search for dislocations.

direction field, surface roughness, speckle interferogram, dislocation density.

Nalimov AG, Kotlyar VV, Skidanov RV. Surface roughness evaluation using a direction field. Computer Optics 2003; 25: 71-73.


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